- Particle Sampling Films/Strips
- Particle Sampling Films/Strips
Particle Sampling Materials
Professional sampling films and materials for collecting surface and falling particles, designed for analysis with JEDEX S-Series particle counters, Microscope, SEM/EDS, LIBs, FTIR and other instruments.
13+
Products
5μm
Particle Ctrl
6
Intl. Patents
JEDEX Transparent Film + Particle Counter — Why Different?
Superior Detection Efficiency
The combination of JEDEX transparent film and JEDEX surface particle counters delivers significantly higher detection efficiency compared to black film or white membrane methods.
Patented Structural Innovation
The patented multi-layer structure makes particle collection extremely convenient and eliminates the need for a separate carrier, dramatically reducing costs. Load directly into the counter after collection.
Transparent Film + Counter
Maximized detection
3-Layer Patented Structure
No carrier · Cost savings
Collect → Load → Count
Faster workflow
Patents: KR 10-1582461 / US 9,964,480 / JP 6337388 / EU 3211397 / CN ZL2015800572836 / VN 29661
Custom Manufacturing Available
Custom specifications — size, adhesion, grid pattern — tailored to your requirements. Surface Particle Sampling Films
Collect 5–5000μm particles from flat surfaces for analysis with JEDEX counters, Microscope, SEM/EDS, LIBs, FTIR.
Applications
- Particle collection for JEDEX S-Series counters
- SEM/EDS analysis sample collection
- Semiconductor FAB PM surface inspection
- Microscope observation (low/high mag)
- LIBs, FTIR sample preparation
Specifications
SeparationStandard (5μm Controlled)
Particle5μm
Sampling70×25mm (Grid area 5mm)
Size120×30mm (Handle 15mm + Cover 25mm)
Layers3 (Peel Off for Sampling / Film / Peel Off Cover)
GridOrange Grid, 1000μm
HandleYellow (Nitrile glove compatible)
Applications
- Particle collection for JEDEX S-Series counters
- ASML stepper and ultra-clean equipment PM sampling
- Surface particle collection where adhesives cannot be used
- Ultra-clean sample collection for SEM/EDS
- Semiconductor FAB ultra-clean process inspection
Specifications
Particle Ctrl1μm Controlled
CollectionAdhesive-Free — Film elasticity
CleanlinessUltra-Clean
Sampling70×25mm (Grid area 5mm)
Size120×30mm (Handle 15mm + Cover 25mm)
Layers3 Layers
GridGrid, 1000μm
Applications
- Particle collection for JEDEX S-Series counters
- Microscope observation (low/high mag)
- SEM/EDS analysis (Hitachi, JEOL, etc.)
- General surface particle sampling
Specifications
SeparationStandard
Particle5μm
Area20×50mm
Size90×30mm, 3 Layers
GridGreen 1000μm (Peel Off)
Applications
- Particle collection for JEDEX S-Series counters
- Microscope grid cell analysis
- 500μm grid precise location mapping
- SEM/EDS sample collection
Specifications
SeparationStandard
Particle5μm
Area20×50mm
Size90×30mm, 3 Layers
GridGreen 500μm high-density (Base)
Applications
- Particle collection for JEDEX S-Series counters
- Particle removal + sampling (ultra-high force)
- Equipment cleaning + particle analysis in one step
- Microscope/SEM/EDS compatible
Specifications
SeparationUltra-High
Particle5μm
Area20×50mm
Size90×30mm, 3 Layers
GridRed 1000μm (Base)
Falling Particle Sampling
Glass and silicon wafers for collecting falling particles in sealed environments such as chambers, ovens, and plasma equipment.
Wide-Area Particle Sampling
Wide-format dedicated film for collecting broad-area surface particles, falling particles, and airborne particles.
Applications
- Particle collection for JEDEX S-Series counters
- Surface and wide-area falling particle collection
- Airborne particle sampling
- Cleanroom/clean bench monitoring
Specifications
SeparationUltra-High
Area100×150mm
Size212×104mm, 3 Layers
GridGreen 1000μm (Base)
Attachment-Type Sampling
Attach to mobile robots, magazines, and parts to detect particles captured along travel paths.
Surface Particle Collection & Counting Procedure
5–5000μm particles on flat surfaces | Patented structure
Prepare Film Select the particle collection film matching the size of the surface to be inspected. |
Collect Particles Place the adhesive side on the inspection surface and press with a sampling stick to transfer particles. |
Pack & Transport Re-attach the protective cover, place in the packaging box, and transport to the counter location. |
Load Counter Load the film into the loading fixture of the S-Series counter. |
Detect & Count Particle detection and counting proceed automatically. |
B2B Volume Orders · Custom Manufacturing Quote
Volume-based pricing available. Custom manufacturing also available.