- High performance testing device with full automation

- Realization of making the background particle level close to zero

- Even 1 small sample such as disposal mask or wiper can be tested so that the expenses for testing can be significantly reduced

- The rapid cleaning of chamber is possible due to introduction of computer controlled cleaning mode

- As it has three holes for fixing the sample particles, the various devices can be connected at the same time.

- Patented unique structure is adopted (the patent registration is completed in Aug. 2010).

- Conditions of use: High level clean room with Class 100 or higher

- Lowered background level compared to our existing series

- The testing of more voluminous sample than our existing series is possible

- Error arising from the folding of sample caused by the rotation of drums in opposite directions is minimized.