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Surface Particle Counters(Micron)

. Jedex S series devices guarantee detection power and 

speed that are incomparable to machine vision and AOI 


Jedex's patented technology delivers;

1. Jedex's patented transmissive detector: Excellent detection of particles present on the surface or inner layer of transparent and translucent glass or film. (Patent )


2. Jedex patented hybrid detection method: The Jedex S series combines light scattering + image analysis to inspect more areas in less time than conventional equipment, resulting in very high productivity. (Patent )


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