Semiconductor FAB

M7000/M1000R25 (new)

Parts cleanliness and particle testing system for Shower Heads, Electrodes, ESC, Chucks, Robot Arms, Focus rings, Cleanroom Wipers, FOUPs ..,

Helmke Drum

T700H Helmke Drum

T700H Helmke Drum with Clean Air Supply System (FFU). IES-RP-CC 3.3

Tumble / JIS

T802

Particle Testing System for Cleanroom supplies (sub-micron)

Semiconductor Packaging , Testing

SPro (Auto focus, fast scan)

SPro Series ~ 100 mm samples

Semiconductor Packaging , Testing

SA (Auto Scan, Smart Counting)

Wide Detector & High Performance, For small to large size (~ 300 mm) samples

SEMI E195-0925 - Test Method Using Adhesive Replacement ..

S5 Series

Multi-layer / Film

S300 Series

Surface/Glass Particle Counter