Press release regarding the SEMI E195 Chamber Particle Inspection Solution. - News - 회사소개

News

================================================================================

  PRESS RELEASE                        JDX-PR-E195-2026   MM DD, 2026

  JEDEX Inc.  Contamination Control Lab  press@jedex.com   +82-70-8233-7766

  FOR IMMEDIATE RELEASE

================================================================================

JEDEX Expands Its SEMI E195 Compliant Solution Lineup

─ Official Launch of the "S505 + DD Films" Surface Particle Assessment Package ─

[YONGIN, KOREA — MM DD, 2026]  JEDEX Inc. (www.jedex.com), a contamination

control specialist for the semiconductor industry, today announced the expansion

of its SEMI E195 compliant surface particle assessment solution lineup with the

official launch of the "S505 + DD Films" integrated package — a unified offering

targeting all four semiconductor value-chain segments: equipment makers (OEM/IDM),

parts cleaning vendors, component manufacturers, and PM service providers.

The package implements the Adhesive Replacement Substrate (ARS) method specified

in SEMI E195 (Test Method Using Adhesive Replacement Substrates to Assess

Particulate Surface Contamination on Critical Chamber Components) on a single

platform. The non-destructive method transfers particles from Critical Chamber

Component (CCC) surfaces onto an adhesive film and counts them optically,

achieving dual compliance with SEMI E195 and ISO 14644-9.

▶  S505 Key Specifications

    · Please contact us for more detail.

▶  DD-series Films  (Patents: KR · CN · EU · JP · US · VN)

    · Standard: DD FAB-200HR  (FAB-grade high-adhesive · high-clean)

    · Tight features: DD-500HR  (slots, grooves, edges)

    · Software: MicroLabo Ver. 9.0.1  —  immediate Excel output

▶  Use Cases by Segment

    · Equipment Makers  : Standardize CCC incoming inspection; specify cleanliness

                          specs in OEM–Tier 1 contracts

    · Cleaning Vendors  : Quantitative before/after comparison; include SEMI E195

                          compliant report in shipment package

    · Component Makers  : 1–2 sec line-side QC; strengthen CoA with ISO 14644-9

    · PM Providers      : On-site / PM-truck operation; instant post-PM diagnosis

                          with a single adhesive film

JEDEX plans to build on this lineup into a comprehensive cleanliness management

portfolio covering airborne particle monitoring, critical component inspection,

and cleaning solutions.

■  About JEDEX  JEDEX Inc. is a contamination control specialist providing

surface and airborne particle detection solutions for semiconductor equipment

parts, including S505, DD Films, ParticlePRO, M series, and MONACO.

HQ: #1612 Heungdeok IT Valley, Giheung-Gu, YongIn-Si, GyeongGi-Do, Korea.

────────────────────────────────────────────────────────────────────────────────

  Contact: Contamination Control Lab  press@jedex.com  /  +82-70-8233-7766

  Available: Hi-res product photos · measurement data samples · demo coverage